rmvpFlF7H3LewYIiAHQcjgxYOecIfvyKpXr9MA40.jpeg

X-Ray system for cross-sectional examination

GE - X|aminer

System with resolution 0.5 μm, test object size 510x510mm. Specially designed for testing electronic circuit boards....

Technical Description

  • Automatic X-ray inspection system with Micro-level resolution for inspection of small mechanical parts and circuit boards in semiconductor and SMT industries...
  • Resolution 0.5 μm
  • Microfocus X-ray tube 160kV/20W
  • Digital image resolution reaches 2 megapixels
  • Magnification (2D): 75x
  • Adjustable viewing angle: tilt ± 70°, rotate nx 360° (optional)
  • Maximum sample test size 510 mm x 510 mm; Control on 3 axes
  • Maximum test sample weight: 5 kg
  • Compact cabin system suitable for any laboratory or production line

Applications

  • Multilayer PCB Quality Testing
  • Check the structure of BGA chips
  • Check the pins of the components on the circuit board: filling, pin concave, not soldered...
  • Used in chip and circuit board manufacturing plants, and where small and thin metal parts need to be inspected.

Related Products

aE02OxSzYaW2HbcyJwEzV8dAOm9jnVowsEFJ0s4j.png

X-Ray system for cross-sectional examination

GE - Nanotom M

18.jpg

X-Ray system for cross-sectional examination

GE - Nanotom S

Kto7O4Z6tVwb3a847nl6zcInayIOkgHrz03KH0e4.png

X-Ray system for cross-sectional examination

GE - Nanome|x

GE - microme|x

X-Ray system for cross-sectional examination

GE - microme|x

Are you interested in our products?
Need a quote for a product or equipment?

Please contact our team of experts for free and professional advice