X-Ray system for cross-sectional examination

Name: GE - Nanotom S
Rating: 4.7 (132 reviews)

GE - Nanotom S

Nano computed tomography (CT) imaging system with 180kV/15W energy, the system is suitable for applications...

X-ray inspection system with CT technology is suitable for applications in material research, ore samples, mold inspection, electronic - semiconductor parts, metal mechanical parts, complex assemblies...
Combining 2D digital X-ray imaging and CT scanning technology
180kV/15W Bipolar X-ray Tube
2D magnification: 1.5 -> 100 times
Detectable small size: 200nm; 3D resolution: < 500 nm
Maximum test sample size (H x D): 150 mm x 120 mm (/250mm x 240mm); Control on 5 axes
Maximum test sample weight: 2 kg (/3 kg)
Function to reproduce image with dimensions and compare with CAD drawing (Optional)

The device is used to inspect small and highly sophisticated parts.
Used in many fields of science, research, and electronic manufacturing.
Detect defects quickly in high resolution, create 3D images and export detailed drawings.