X-Ray system for cross-sectional examination

Name: GE - Nanotom M
Rating: 4.7 (132 reviews)

GE - Nanotom M

Nano CT imaging system with 2 options Micro CT and Nano CT, 3D. System with high spatial resolution for large samples. Automated inspection with C...

X-ray inspection system with CT technology is suitable for applications in material research, ore samples, mold inspection, electronic - semiconductor parts, metal mechanical parts, complex assemblies...
Combining 2D digital X-ray imaging and CT scanning technology
180kV/15W Bipolar X-ray Tube
2D magnification: 1.5 -> 100 times
Detectable small size: 200nm; 3D resolution: < 500 nm
Maximum test sample size (H x D): 150 mm x 120 mm (/250mm x 240mm); Control on 5 axes
Maximum test sample weight: 2 kg (/3 kg)
Function to reproduce image with dimensions and compare with CAD drawing (Optional)