X-Ray system for cross-sectional examination
GE - microme|x
The system with high resolution 0.2 μm is well used in semiconductor industry (SMT), test object size 680x635mm. Specially designed for board testing...
Gọi (+84) 828 31 08 99 để được tư vấn.
Technical Description
- Automatic X-ray inspection system with Micro-level resolution for inspection of small mechanical parts and circuit boards in semiconductor and SMT industries...
- Resolution 0.5 μm
- Microfocus 180kV/20W High Power X-ray Tube
- Digital image resolution reaches 2 megapixels
- Magnification (2D): 1970x, magnification (3D): 100x
- Adjustable viewing angle: 0 -> 70 degrees
- Maximum sample test size (H x D): 680 mm x 635 mm; Control on 5 axes
- Maximum test sample weight: 10 kg
- OPTIONAL 3D CT function with CT scanning in just 10 seconds
- Compact cabin system suitable for any laboratory or production line
