X-Ray system for cross-sectional examination
GE - Nanome|x
System with 0.5 μm resolution, test object size 680x635mm. Specially designed for electronic board testing, good contrast with DXR250RT screen. T...
Gọi (+84) 828 31 08 99 để được tư vấn.
Technical Description
- Automated X-ray inspection system with Nano-level resolution for inspection of small mechanical parts and circuit boards in semiconductor and SMT industries...
- Resolution up to 200 nm
- Nanofocus 180kV/15W high power X-ray tube
- Digital image resolution reaches 2 megapixels (Optional 4 megapixels)
- Magnification (2D): 1970x; Magnification (3D): <300x
- Adjustable viewing angle: 0 -> 70 degrees
- Maximum sample test size 680 mm x 635 mm; Control on 5 axes
- Maximum test sample weight: 10 kg
- OPTIONAL nanoCT function with CT scanning in just 10 seconds
- Compact cabin system suitable for any laboratory or production line
Applications
- Multilayer PCB Quality Testing
- Check the structure of BGA chips
- Check the pins of the components on the circuit board: filling, pin concave, not soldered...
- Used in chip and circuit board manufacturing plants, and where small and thin metal parts need to be inspected.
- All apps are tested in real time very well
