X-Ray system for cross-sectional examination

Name: GE - V|tome|x S
Rating: 4.7 (132 reviews)

GE - V|tome|x S

igh resolution CT system for 2D and 3D inspection with 2 options of Micro CT and Nano CT tubes. Tubes with 2 options: 180kV/15W and 240...

X-ray inspection system with CT technology is suitable for applications in material research, ore samples, mold inspection, electronic - semiconductor parts, metal mechanical parts, complex assemblies...
Combining 2D digital X-ray imaging and 3D CT scanning technology
240kV/320W (or 160KV/ 320W) Bipolar X-ray Tube
2D magnification: 1.46 -> 180 times; 3D magnification: 1.46 -> 100 times
Detectable small size: 1μm; 3D resolution: < 2 μm
Maximum test sample size (H x D): 420 mm x 260 mm; Control on 5 axes
Maximum test sample weight: 10 kg
Function to reproduce image with dimensions and compare with CAD drawing (Optional)