X-Ray system for cross-sectional examination

Name: GE - v|tome|x m
Rating: 4.7 (132 reviews)

GE - v|tome|x m

High resolution CT system for 2D and 3D inspection with 2 options of Micro CT and Nano CT tubes. 300 kV/500W chamber tube. High resolution <...

CT technology X-ray inspection system is suitable for applications of material research, ore samples, mold inspection, electronic - semiconductor parts, metal mechanical parts, complex assembly... Combining 2D digital X-ray photography and 3D CT imaging technology
300kV/500W Bipolar X-ray Tube
Compact system suitable for laboratories
2D magnification: 1.46 -> 180 times; 3D magnification: 1.25 -> 160 times
Detectable small size: 1μm; 3D resolution: < 2 μm
Maximum test sample size (H x D): 600 mm x 300 mm (can be increased to 600 x 500 mm with limited mobility); 400mm x 300mm (when 3D CT scanning); 5-axis control
Maximum test sample weight: 50 kgFunction of reproducing images with dimensions and comparing with CAD drawings (Optional)

The device is used to inspect small, highly sophisticated parts and has the option to inspect larger parts.
Used in many fields of science, research, and electronics manufacturing.
In the mechanical manufacturing industry, design models with not too large details.
Detect defects quickly in high resolution, create 3D images and export detailed drawings.