ir1ZUpwnMh78nTGb1YYCcazCetzV65YWjY6a6BgX.png

X-Ray system for cross-sectional examination

GE - v|tome|x L450

The L 450 high resolution 2D and 3D CT system with Micro CT option. Used for inspection of very large objects...

Technical Description

  • X-ray inspection system with CT technology is suitable for applications in material research, ore samples, mold inspection, electronic - semiconductor parts, metal mechanical parts, complex assemblies...
  • Combining 2D digital X-ray imaging and 3D CT scanning technology
  • Bipolar X-ray tube 240kV-450kV/1500W
  • 2D magnification: 1.25 -> 555 times; 3D magnification: 1.25 -> 333 times
  • Detectable small size: 1μm; 3D resolution: < 1.3 μm
  • Maximum test sample size (H x D): 1000 mm x 800 mm; Control on 7 axes
  • Maximum test sample weight: 100 kg
  • Function to reproduce image with dimensions and compare with CAD drawing (Optional)

Applications

  • Used in mechanical manufacturing industry, special sample design in casting industry, large sample details
  • Commonly used industries: automobiles, engine block manufacturing, casting industry...
  • Detect defects quickly, create 3D images and export detailed drawings.

Related Products

aE02OxSzYaW2HbcyJwEzV8dAOm9jnVowsEFJ0s4j.png

X-Ray system for cross-sectional examination

GE - Nanotom M

18.jpg

X-Ray system for cross-sectional examination

GE - Nanotom S

Kto7O4Z6tVwb3a847nl6zcInayIOkgHrz03KH0e4.png

X-Ray system for cross-sectional examination

GE - Nanome|x

rmvpFlF7H3LewYIiAHQcjgxYOecIfvyKpXr9MA40.jpeg

X-Ray system for cross-sectional examination

GE - X|aminer

Are you interested in our products?
Need a quote for a product or equipment?

Please contact our team of experts for free and professional advice