X-Ray system for cross-sectional examination

Name: GE - v|tome|x L240- L300
Rating: 4.7 (132 reviews)

GE - v|tome|x L240- L300

High resolution L 300 CT system for 2D and 3D scanning with Micro CT option. 300 kV/500Wm chamber for test specimens....

X-ray inspection system with CT technology is suitable for applications in material research, ore samples, mold inspection, electronic - semiconductor parts, metal mechanical parts, complex assemblies...
Combining 2D digital X-ray imaging and 3D CT scanning technology
Bipolar X-ray tube 180kV-240kV/320W (300kV/500W)
2D magnification: 1.25 -> 333 times; 3D magnification: 1.25 -> 200 times
Detectable small size: 1μm; 3D resolution: < 2 μm
Maximum test sample size (H x D): 600 mm x 500 mm; Control on 5 axes (with L240), 7 axes (with L300)
Maximum test sample weight: 50 kg
Function to reproduce image with dimensions and compare with CAD drawing (Optional)

The device is used to inspect small, highly sophisticated parts and has the option to inspect larger parts.
Used in many fields of science, research, and electronics manufacturing.
In mechanical manufacturing, special pattern design in casting industry, turbine blades.
Detect defects quickly in high resolution, create 3D images and export detailed drawings at the same time.