Handheld roughness meter with spectrum display
Taylor Hobson - Surtronic S-100 Series
The latest design of the basic Surtronic roughness meter line, combining a 4.3” color touch screen
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Technical Description
- Optional advanced measurement parameters to suit applications
- USB connection for charging, printing and storage with external memory card with unlimited capacity
- Ability to measure on multiple surfaces and the measuring head can be raised and lowered easily
- V-shaped rubber base helps the device grip on curved as well as flat surfaces
- Rubber shell covers the outside of the device to protect against impact
- Measure 2000 times on 1 full battery charge
- Meets ISO 4287, ISO 13565-1, ISO 13565-2, ASME 46.1, JIS 0601, N31007 standards
Specifications
| Overview | |||
| Technical | S-116 | S-128 | |
| Languages | Basic | English, French, German, Italian, Spanish | |
| Extended | Czech, Portuguese, Romanian, Hungarian, Swedish, Russian | ||
| Asian | Japanese | ||
| Data output | On-screen | up to 7 results per page, selectable on-screen graph with XZ axis | |
| Printer | Output settings, results and high resolution profile graph | ||
| PC Connection | Full data analysis with Talyprofile | ||
| Data storage | Internal | 100 measurement results, 1 raw profile | |
| USB (4GB supplied) | >39,000 raw profiles, up to 100,000 results per batch (>70 batches) | ||
| PC connection | Unlimited data storage | ||
| SPC / stats | Internal | Optional | Min, Max, Mean, StdDev of stored results |
| USB (4GB supplied) | Optional | ASCII export of all results for SPC | |
| PC connection | full SPC and tollerancing of all parameters using Talyprofile software | ||
| Battery | Charger | USB 5v 1A 110-240VAC 50/60Hz | |
| Charging time | 4 hours | ||
| Battery life | 2000 measurements | ||
| Standby time | 5000 hours | ||
| InstantOn | max 1 sec from standby to ready to measure | ||
| Auto sleep function | 30 sec - 6 hours | ||
| Measurement capability | S-116 | S-128 | |
| Gauge | Range | 200 µm / 100 µm / 10 µm | 400 µm / 100 µm / 10 µm |
| Resolution | 100 nm / 20 nm / 10 nm | 50 nm / 10 nm / 5 nm | |
| Noise floor (Ra) | 250 nm / 150 nm / 100 nm | 150 nm / 100 nm / 50 nm | |
| Repeatability (Ra) | 1 % of value + noise | 0.5 % of value + noise | |
| Pickup type | Inductive | ||
| Gauge force | 150-300 mg | ||
| Stylus tip radius | 5 µm (200 µin) default / 2 µm (80 µin) or 10 µm (400 µin) optional | ||
| Measurement type | Skidded | ||
| Calibration | Process | Automated software calibration routine | |
| Standards | Able to calibrate to ISO 4287 roughness standards | ||
| Analysis | Filter cut-off | 0.25 mm / 0.8 mm / 2.5 mm | |
| Filter type | 2CR / Gaussian | ||
| Evaluation length | 0.25 mm - 17.5 mm (0.01 in - 0.70 in) | 0.25 mm - 25.0 mm (0.01 in - 1.00 in) | |
| Max X axis range | 17.5 mm | 25.5 mm | |
| Speed | Measuring speed | 1 mm / sec (0.04 in / sec) | |
| Returning speed | 1.5 mm / sec (0.06 in / sec) | ||
