Modular roughness and profile measuring instrument

Jenoptik - Waveline W800

This modular, semi-automatic, and flexible roughness and profile measurement system is ideal for measurement and production environments,

Measure roughness and contour in the same system → versatile, reduces equipment
Modular design → easy to expand and customize according to application.
Manual/semi-automatic operation → suitable for QC and production departments.
Quick Change Adapter (QCA) → quick probe change, no tools required.
Magnetic probe + RFID → self-identification, self-configuration for measurement
Diverse probe system:
- Roughness (TKU, Surfscan)
- Contour (Digiscan)
- High-end (Nanoscan)
Specially designed traverse unit → easy access to difficult measurement locations
High accuracy, good mechanical stability → suitable for precise measurements
High travel speed (up to ~200 mm/s) → shortens measurement time.