Jenoptik - Waveline W600

Compact roughness and profile measuring instrument

Jenoptik - Waveline W600

Jenoptik Waveline W600

Technical Description

  • Measure roughness or contour (or a combination) on the same platform. 
  • Compact design – easy to operate → suitable for QC & production 
  • Manual height adjustment → precise probe positioning 
  • Optimized traverse structure → better access to difficult measurement locations 
  • Quick Change Adapter (QCA) → quick probe replacement, automatic recognition 
  • Modern high-resolution probes (TKU400, Digiscan, etc.) 
  • Magnetic sensor arm + RFID → quick change, self-configuration 
  • Modular design → expandable in the future 
  • High mechanical stability → ensures measurement quality

Applications

  • Metrology lab
  • QC inspection near the production line.
  • Automotive, precision engineering, bearings, machined parts

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