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Compact roughness and profile measuring instrument - Jenoptik - Waveline W600 | Quoc Huy Technique
Jenoptik - Waveline W600
Compact roughness and profile measuring instrument
Jenoptik - Waveline W600
Jenoptik Waveline W600
Request a solution & quote
Gọi (+84) 828 31 08 99 để được tư vấn.
Technical Description
Measure
roughness or contour (or a combination)
on the same platform.
Compact design
– easy to operate
→ suitable for QC & production
Manual height adjustment
→ precise probe positioning
Optimized traverse structure
→ better access to difficult measurement locations
Quick Change Adapter (QCA)
→ quick probe replacement, automatic recognition
Modern high-resolution probes
(TKU400, Digiscan, etc.)
Magnetic sensor arm + RFID
→ quick change, self-configuration
Modular design
→ expandable in the future
High mechanical stability
→ ensures measurement quality
Applications
Metrology lab
QC inspection near the production line.
Automotive, precision engineering, bearings, machined parts
Gloss Measurement - Surface Roughness - Surface Profiling
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