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Ultra-compact handheld roughness measuring device - Jenoptik - Waveline W40 | Quoc Huy Technique
Jenoptik - Waveline W40
Ultra-compact handheld roughness measuring device
Jenoptik - Waveline W40
Jenoptik Waveline W40
Request a solution & quote
Gọi (+84) 828 31 08 99 để được tư vấn.
Technical Description
Ultra-compact
design (~270 g), battery-powered → optimized for field measurements.
Measurements were taken using the tactile profile
method , accuracy class 1.
Measurement range:
±100 µm | Resolution: 5 nm
Battery life up to
~800 measurements per charge
The color screen
interface and click wheel are easy to use.
USB/Bluetooth
connectivity , mobile printer option.
Applications
On-site QA/QC
Quick inspection on the production line
Gloss Measurement - Surface Roughness - Surface Profiling
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