Professional roughness measuring device
Jenoptik - Waveline W15
Professional roughness measuring device
Gọi (+84) 828 31 08 99 để được tư vấn.
Technical Description
- Mobile measurement system + PC-based analysis (Evovis)
- Measure at all positions: horizontal, vertical, overhead.
- Measurement range: ±100 µm | 5 nm
- Unlimited measurement program and memory
- Supports ISO 21920, ISO 4287…
- Expand to become a fixed measurement station.
Applications
- Measurement room
- In-depth surface analysis
