Taylor Hobson - Form Talysurf PGI series
Gloss Measurement - Surface Roughness - Surface Profiling
Taylor Hobson - Form Talysurf PGI series

High-end Roughness and Contour Analyzer

Taylor Hobson - Form Talysurf PGI series

Form Talysurf® PGI Series is a versatile line of roughness and profile measurement and analysis systems using laser...

Technical Description

  • The PGI series has a wide range of unique options for traverse, probe, resolution and linearity allowing the user to have an optimal system for quality control of the production of bearings, optics and mechanical parts requiring high precision.
  • Ability to measure and display 2D/3D on screen
  • Horizontal and vertical movement with wide working range
  • High precision
  • Just measure once to collect full data such as roughness, contour, waveform...
  • Ability to program the device to work automatically
  • Diamond probe tips with various options allow for a wide range of applications
  • μltra software with many options effectively supports measurement and analysis of results
  • Anti-vibration system with pneumatic support
  • Save time, simple operation

Specifications

Overview
System performance20002000E2000S
Calibration Form Error (Pt)< 0.20 μm (8 μin)
System noiseRq < 2 nm (0.08 μin), Rz < 10 nm (0.39 μin)
Radius measurement uncertainty0.1 - 10mm (0.004 - 0.39 in) - < 1 μm of nominal
10 - 360mm (0.39 - 14.17 in) - 0.01% to 0.006% of nominal
Inclination measurement uncertainty0.5 arc minute
Repeatability of Z axis indicationFlat surface - 0.08 μm (3.1 μin)
Curved surface - 0.08 μm (3.1 μin)
Horizontal performance20002000E2000S
Traverse length – X max / min120 mm / 0.1 mm (4.7 in / 0.004 in) or 200 mm / 0.1 mm (7.9 in / 0.004 in)
Traverse speeds13 mm/s (0.51 in/s) max
Measuring speed0.25 mm/s, 0.5 mm/s, 1 mm/s & 2 mm/s (0.01 in/s, 0.02 in/s, 0.04 in/s & 0.08 in/s)
Minimum data sampling interval in X0.125 μm (5 μin)
Straightness accuracy (Pt)120 mm Traverse unit - 0.08 μm (3.2 μin) / 200 mm Traverse unit - 0.110 μm (4.3 μin)
X axis indication accuracy(1 + 0.02 L) μm
Vertical performance20002000E2000S
Nominal measuring range (Z) 20 mm (0.79 in) 
Resolution (Z)5.3 nm (0.21 μin)1.3 nm (0.05 μin)0.3 nm (0.01 μin)
Range to resolution3,773,585 : 115,384,615 : 166,666,666 : 1
Linearity accuracy0.07 + 0.03 Z [mm] μm
(3 + 30 Z[in] μin)
Stylus arm lengthStandard length 100mm
Tip size2μm radius conisphere diamond
Force < 1mN
Measuring station20002000E2000S
Motorized tilting of traverse unitOptional ±9° from horizontal
Instrument weight223 Kg (450 mm column) (optional 700 mm column 237 Kg)
Motorized vertical column450 mm (17.7 in) (optional 700 mm (29.5 in))
EnvironmentElectrical supply
Storage temperature5 ºC to 40 ºC (41 ºF to 104 ºF)Supply typeAlternating supply, single phase with
earth (3-wire system)
Storage humidity10% to 80% relative, non condensingInstrument and computer voltage90 V - 230 V
Operating temperature18 ºC to 22 ºC (64 ºF to 72 ºF)Frequency47 Hz to 63 Hz
Temperature gradient< 2 ºC per hour (< 3.6 ºF / hour)Supply voltage transients – width EN 61000 - 4 - 4 : 1995
Operating humidity45% to 75% relative, non condensingPower consumption500 VA
Maximum RMS floor vibration3 μm/s (120 μin/s) at < 50 HzSafetyEN 61010 - 1 : 2001
6 μm/s (200 μin/s) at < 50 HzEMCEN 61000 - 6 - 4 : 2001
EN 61000 - 6 - 1 : 2001

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