Benchtop RoHS Analyzer
HORIBA - MESA-50K
New line of X-ray fluorescence analyzers with large sample chamber, equipped with SDD detector
Gọi (+84) 828 31 08 99 để được tư vấn.
Technical Description
1. Speed
- The Silicon Dioxide Detector (SDD) reduces analysis time and increases sensitivity for high throughput analysis.
2. Small, compact size
- MESA-50K has a large sample chamber without compromising on work area. Connects to computer via USB port.
3. Simple
- Reduced maintenance (operation without liquid nitrogen)
- No vacuum pump required
- Simple and intuitive measuring process for all types of materials
4. Smart
- English/Japanese/Chinese interface
- Excel® Data Management Tools
5. Safety
- No worries about X-ray leakage
Specifications
| Basic parameters | Principle | Energy dispersive X-ray fluorescence spectroscopy |
|---|---|---|
| Application objectives | RoHS, ELV, Halogen Free | |
| Measuring element | 13Al - 92U | |
| Sample type | Solid, Liquid, Powder | |
| X-ray generator | X-ray tube | Max 50kV, 0.2mA |
| X-ray projection size | 1.2mm, 3mm, 7mm (Automatic switching) | |
| X-ray filter | 4 types (Automatic switching) | |
| Probe | Type | SDD (Silicon Receiver) |
| Signal processor | Digital pulse processor | |
| Sample chamber | Measurement conditions | Air |
| Sample observation | CCD camera | |
| Sample chamber size | 460 x 360 x 150 mm [W x D x H] | |
| Utilities | Operate | PC (Windows® 7) |
| Power supply | 100-240V, 50/60Hz | |
| Size | 590 x 590 x 400 mm [W x D x H] | |
| Weight | 60 kg | |
| Software | Analysis function | Multilayer plating/coating thickness measurement (Optional), Sb/As analysis (Optional) |
