Scanning probe
Renishaw - SP25M
Ideal for complex shape and scanning measurement applications, with a combination of scanning and contact measurement, providing flexibility and high accuracy.
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Technical Description
SP25M - Compact and versatile scanning probe system
- Two sensors in one - scanning probe and touch probe using TP20 probe modules.
- Fast and automatic changeover between modular components.
- Excellent scanning accuracy with M3 probe range from 20 mm to 400 mm (0.79 in to 15.75 in).
- Cheap starter kit, easy to expand.
- Isolated optical measurement technology delivers unparalleled measurement performance, even with long measuring heads.
- Compatible with PH10M PLUS / PH10MQ PLUS articulated probes, allowing access to more features with fewer probes.
- Ultra-compact system with Ø25 mm (Ø0.98 in) diameter for outstanding detail access.
- Compatible with probe extension rods up to 100 mm.
- Flexible pricing where ports can be easily configured to accommodate any system component.
- Bump-stop collision protection in Z axis, along with removable probe holder for XY collision protection.
Specifications
| Specifications: | |
| Assemble | Renishaw automatic coupling: PH10M, PH10MQ or PH6 head |
| Exploratory properties | 3-Axis Analog Measurement (X, Y, Z) |
| Rotational motion in the XY plane with translational motion in the Z plane | |
| Measurement range | Deviation ±0.5 mm (±0.02 in) in all directions in all directions |
| Excessive range of motion | ±X, ±Y = 2,0 mm (0,08 in) |
| +Z = 1.7 mm (0.07 in) | |
| -Z = 1,2 mm (0,05 in) | |
| Collision protection | X, Y, -Z via module disconnect or stylus holder |
| +Z adopts integrated collision blocking design | |
| Power supply | +12V (±5%), -12V (+10% / -8%), |
| +5 V (+10% / +13%) DC at probe | |
| Probe Calibration | SP25M requires a non-linear cubic polynomial calibration method |
