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Phantom for long-term stability testing of digital detector array (DDA) systems.
The Type 2 Duplex Plate phantom enables inspection of DDA system parameters such as basic spatial resolution, contrast sensitivity, SNR, and signal level to assess initial performance and long-term stability. These tests are required and described in detail by ASTM E2737 and should be performed periodically to verify process control and long-term stability.
IQI, Gauges, Inspection
| Item | Details |
|---|---|
| A | Main base – thin: HM 5 mm / LM 12 mm |
| B | Top plate – thick: HM 15 mm / LM 38 mm |
| C | Hole-type IQI – .SS 25 / AL .50: Contrast sensitivity (edge or hole) |
| D | Hole-type IQI – SS .81 / AL 2.0: Contrast sensitivity (edge or hole) |
| E | ROI – thin plate: Signal-to-noise ratio, Signal level |
| F | ROI – thick plate: Signal-to-noise ratio, Signal level |
| G | Duplex wire-type IQI: Basic spatial resolution, Unsharpness |
| Dimensions: | 400 x 300 x 15 / 38 mm 15.75 x 11.81 x 0.59 / 1.50 inch |
Hole-type IQI on the top plate is located at the center of the plate:
Reduces scattered radiation and the gradient across the IQI, improving repeatability in contrast-sensitivity tests.
Clear area beside the long edge of the hole-type IQI:
Allows contrast sensitivity to be evaluated at the IQI edge as well, improving repeatability compared with evaluation at the IQI holes.
Region of interest (ROI) on the top plate near the hole-type IQI:
The lowest gradient within the ROI improves repeatability in signal-to-noise ratio and signal-level tests.
Plastic cutout for the ROI:
The ROI is clearly visible in the X-ray image and easy to evaluate.
Hai Duplex wire-type IQI có thể được chèn vào:
The vertical and horizontal axes can be evaluated in a single image.
Duplex wire-type IQI có thể được tháo ra:
It can be used for other applications.
