Coating thickness XRF analyzer

The coating thickness gauge, paint thickness gauge, and composition analysis device based on X-ray fluorescence (XRF) is a proven technique that provides fast, accurate, and non-destructive analysis results.

Hitachi High-Tech application experts have optimized the FT230 to ensure reliable results for hundreds of applications, including PCB surface finishing and industrial electroplating coatings.

• Every aspect of the FT230 is designed to significantly reduce analysis time.
• Auto-focus minimizes sample loading time.
• Intelligent recognition with Find My Part™ automatically sets up the complete measurement process.
• Large sample view displayed on-screen for excellent observation capability.
• Self-diagnostic mode checks and ensures device stability.
• Fully integrates with other software and offers easy data export.
• User-friendly interface makes it intuitive and easy to use, even for non-specialists.
• Powerful capability to measure up to four plating layers simultaneously on a single substrate.
• Built for durability, offering long-lasting use in demanding production or laboratory environments.
• Complies with ASTM B568 and DIN ISO 3497 standards.
• Helps meet specifications for ENIG (IPC-4552B), ENEPIG (IPC-4556), immersion Sn (IPC-4554), and immersion Ag (IPC-4553A).