Hitachi - CMI760

Handheld Thickness Gauge

Hitachi - CMI760

Inspect copper foil layer, CCL sheets, surfaces, traces, and copper-plated holes all on a single device.

Technical Description

The CMI760 thickness gauge can connect with various probes tailored to specific applications for measuring the copper layer thickness on PCB electronic circuit boards, including copper surfaces, copper-plated holes, and copper traces.

Using Micro-Resistance and Eddy Current measurement methods, it provides accurate, fast, and non-destructive results, unlike traditional methods. This approach saves time and ensures high reliability.

Applications

  • Measure Surface Copper Thickness on PCB Boards
  • Measure Through-Hole Copper Thickness

Specifications

GAUGE SPECIFICATIONS
Dimensions: 29.21 (W) x 26.67 (D) x 13.97 (H).
Weight: 6 lbs. (2.7 kg).
Unit: Select from mils, µm, µin, mm, in., or % as units for display.
Display: Large LCD 480 (H) x 32 (V) pixels, backlit, wide-angle view.
Statistical Display: Readings, standard deviation, mean, high/low.
Charts: Histogram, trend, x-Bar, and r-chart.
SRP-4 PROBE:
Accuracy: ±1% (±0.1 µm) referred to reference standard.
Precision: 0.2% typical.
Electrodeposited Copper: 0.3% typical.
Resolution: 0.1 at > 10, 0.01 at < 10, 0.001 at <1.
ETP PROBE SPECIFICATIONS:
Accuracy: ±0.01 mil (0.25 µm) < 1 mil (25 µm).
Precision: 1.0% at 1.2 mil typical.
Resolution: 0.01 mils (0.25 µm).
Eddy Current: Conforms to method ASTM E376
Thickness Range: 0.08-4.0 mils (1 - 102 µm).
Minimum Hole Size: 35 mils (899 µm).

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