Aczet - Cube

Gold Testing Machine

Aczet - Cube

High-precision gold testing cube.

Technical Description

Measurement Performance

With just a single button press, the device provides results including elemental composition, gold purity percentage, and karat value. Equipped with an X-ray shielding system, it ensures absolute safety for the user.

Sample observation is assisted by a high-quality CCD video camera. The analysis is non-contact and non-destructive, delivering results within 60 seconds to 2 minutes. Extremely user-friendly—simply position the sample to begin.

Capable of detecting up to 20 elements: Au, Ag, Cu, Zn, Ni, Pd, Cd, Rh, Ru, Pt, etc.
Harmful metals such as lead (Pb) and cadmium (Cd), which are prohibited under Circular 22, can also be detected.

The SDD detector enables detection of rare elements such as Iridium (Ir), Osmium (Os), Ruthenium (Ru), and Tungsten (W).

Analysis Software

  • Simultaneous analysis of up to 8 elements
  • Supports detection of up to 20 elements
  • Statistical functions with average value and standard deviation
  • User calibration capability

Sample Positioning

The machine allows adjustable sample positioning based on the size and location of the gold item being tested. The Cube series supports automatic XYZ-axis adjustment for precise and flexible sample alignment.

Compact Design

Thanks to its smart, space-saving design, the device is compact enough to fit seamlessly into any setting—from small jewelry showrooms to full-scale business environments.

Detector Types

Current models commonly use two types of detectors:

  • Silicon Drift Detector (SDD): Offers the highest sensitivity and accuracy available today.
  • Silicon Pin Detector (Si-Pin): Detects many elements such as Au, Pt, Rh, Cu, Zn, Ag, Co, Ru, Pd, Ni, Cr, Mo, Ir, Bi… However, it is less effective at detecting Osmium (Os), which is relevant in Vietnam's gold market. Si-Pin also has slightly slower processing speed compared to SDD.

Coating Thickness Measurement

This feature is especially beneficial in the plating and electronics industries.

Benefits

  • High-precision gold purity testing
  • Determines elemental composition in precious metals
  • Lower initial investment compared to other analytical instruments
  • Minimal operating costs
  • Non-destructive testing method
  • Short sample preparation time
  • Fast analysis results (60 to 300 seconds)
  • Simple technology with high accuracy and repeatability
  • Enables quality control during manufacturing processes

Specifications

ModelCubeCube PINCube SDD
Measurement directionTop to bottomTop to bottomTop to bottom
X-ray tubeMini-focus, high performance, W-target, Spot 0.2mm-0.8mmLong life, high efficiency, air cooledLong life, high efficiency, air cooled
Power source50kV (1.2mA) Software Control Optimized50kV / (1.2mA) programmable50kV / (1.2mA) programmable
DetectorGas Filed Prop CounterSilicon Pin DetectorSilicon Drift Detector
ApplicationAnalysis of gold, silver in the jewelry and alloy industry. Measurement of plating thickness of materials.
Measurement time60s to 180s
CollimatorØ0.3mm or Ø0.5mm, Optional four position collimator change
Sample tableManual adjustment
Supply230VAC, 50/60Hz, 120W / 100W
Measuring chamber glass330 x 200 x 170 mm (WxDxH)
Machine size350 x 450 x 310 mm (WxDxH)
Weight27 kg
OptionalAutomatically adjust the height of the mounting table and focus the image, control the X, Y axis to position and launch/fire the sample with the Joystick.

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